NI (National Instruments), a provider of platform systems dedicated to helping engineers and scientists meet the world's toughest engineering challenges, today announced the NI PXle-6570 Graphics Vector-Based Digital Channel Board and NI Digital Graphics Vector Editor. The products liberate manufacturers of RF integrated circuits, power management ICs, microelectromechanical (MEMS) system devices, and mixed-signal ICs from the closed architecture of traditional semiconductor automated test equipment (ATE).

The test coverage of traditional ATEs often fails to meet the requirements of the latest semiconductor devices. By bringing the semiconductor industry's proven digital test paradigm to semiconductor test systems (STS) based on the PXI open platform and optimizing it with powerful and user-friendly editors and debuggers, users can leverage advanced PXI instrumentation to reduce the cost of testing RF and analog ICs and increase throughput.

"PXI digital mode instruments provide semiconductor engineers with all the digital performance found in high-end digital test platforms, so their introduction is the icing on the STS cake," said Ron Wolfe, vice president of semiconductor test at NI. "If PXIs on the production floor have this capability, they can be a great asset in meeting advanced test requirements. capability, they can easily extend it to test other products while meeting the cost and test requirements of advanced devices."

The NI PXIe-6570 Digital Mode Instrument provides the test capabilities needed for ICs commonly used in the wireless device supply chain and IoT devices at a very affordable price. It features a graphical vector execution rate of 100 MVector/second, independent sources, capture engines, voltage/current parametric functions and up to 256 synchronized digital pins in a single subsystem. Users can take full advantage of PXI's openness and STS, adding or subtracting as many devices as needed to meet the number of device pins and test points required for a test configuration.

The new Digital Pattern Editor software features device pin mapping, specification and graphical vector editing environments for faster test planning; built-in tools such as multi-site and multi-instrument parallel transceivers for seamless product development to production; and tools such as shmoo diagrams and interactive pin views for more efficient debugging and optimization of tests.

Using the same PXI hardware, TestStand, LabVIEW and Digital Pattern Editor software for characterization and product testing reduces the effort required for data correlation, resulting in shorter time to market. PXI hardware inside and outside the STS configuration has a small footprint, saving space in the plant, and can be powered by standard wall-plug power supplies on the characterization lab bench.

"PXI has proven to be an excellent hardware and software integration solution for both the production floor and the characterization lab," added Wolfe. "NI's Graphics Vector-based Digital Channel Boards and Digital Graphics Vector Editors are important innovations that can help device manufacturers and test labs reduce test costs as well as optimize test program development."

Many semiconductor companies are building intelligent test systems based on NI platforms and ecosystems. More than just the production-ready STS family, 1 GHz bandwidth vector signal transceivers, fA-class source measurement units and TestStand semiconductor modules, these systems benefit from more than 600 PXI products covering DC to millimeter wave. They feature a PCI Express third-generation bus interface with high-throughput data transfer capability, as well as sub-nanosecond synchronization and integrated timing and triggering. Users can take advantage of the high productivity of the LabVIEW and TestStand software environments, as well as a vibrant ecosystem of partners, add-on IP, and a team of application engineers, to dramatically reduce test costs, shorten time-to-market, and develop future-proof test equipment that meets the challenges of the future in RF and mixed-signal testing.

Ltd. is a NI alliance, agents, system integrators, mainly NIGPIB, NILABVIEW, NIDAQ, NI boards, NI data acquisition cards and other products. The company has a full set of hardware and software for product testing should be run solutions, the development scope includes ICT, Boundary Scan, functional testing, system testing. Business covers Shenzhen, Guangzhou, Zhuhai, Foshan, Nanjing, Hangzhou, Xiamen, Xi'an, Chengdu, Wuhan, Chongqing, Beijing and other places.

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